{"product_id":"defect-recognition-and-image-processing-in-semiconductors-1997-taylor-francis-ltd-9780750305006-proceedings-of-the-seventh-conference-on-defect-recognition-and-image-processing-berlin-september-1997-germany-international-conference-on-defect-recognition-a","title":"Defect Recognition and Image Processing in Semiconductors 1997","description":"\u003cp\u003eDiscover the essential insights into semiconductor technology with \u003cstrong\u003eDefect Recognition and Image Processing in Semiconductors\u003c\/strong\u003e, edited by the \u003cstrong\u003eInternational Conference on Defect Recognition and Image Processing in Semiconductors\u003c\/strong\u003e held in Templin, Germany, in 1997. Published in 1998, this comprehensive hardback edition spans \u003cstrong\u003e524 pages\u003c\/strong\u003e and delves into advanced techniques for assessing, monitoring, and characterizing defects at both atomic scales and in complete silicon wafers.\u003c\/p\u003e \n\n\u003cp\u003eThis book explores the latest advancements in defect analysis techniques and instrumentation, providing valuable applications for substrates, epilayers, and devices. It offers in-depth investigations into defects in layers and devices, making it an invaluable resource for professionals in materials science, reliability engineering, and condensed matter physics.\u003c\/p\u003e \n\n\u003cp\u003eEnhance your understanding of semiconductor technology and defect recognition with this authoritative guide that bridges the gap between theoretical knowledge and practical applications.\u003c\/p\u003e","brand":"Germany) International Conference on Defect Recognition and Image Processing in Semiconductors (7th : 1997 : Templin","offers":[{"title":"Default Title","offer_id":52247518904662,"sku":"9780750305006","price":515.31,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780750305006.jpg?v=1767772958","url":"https:\/\/www.englishbook.pt\/products\/defect-recognition-and-image-processing-in-semiconductors-1997-taylor-francis-ltd-9780750305006-proceedings-of-the-seventh-conference-on-defect-recognition-and-image-processing-berlin-september-1997-germany-international-conference-on-defect-recognition-a","provider":"Bookshop","version":"1.0","type":"link"}