{"product_id":"digital-holography-for-mems-and-microsystem-metrology-john-wiley-sons-inc-9780470978696-anand-asundi","title":"Digital Holography for MEMS and Microsystem Metrology","description":"\u003cp\u003eExplore the cutting-edge world of digital holography with \u003cstrong\u003eDigital Holography for MEMS and Microsystem Metrology\u003c\/strong\u003e by \u003cstrong\u003eAnand Asundi\u003c\/strong\u003e. Published by \u003cstrong\u003eJohn Wiley \u0026amp; Sons Inc\u003c\/strong\u003e in 2011, this hardback edition spans \u003cstrong\u003e228 pages\u003c\/strong\u003e and serves as a comprehensive guide to the industrial inspection of digital holography. The book delves into the practical applications of digital holography for characterizing Microelectromechanical Systems (MEMS), measuring residual stress, and evaluating device designs. With a focus on holographic testing and image processing, this essential resource is perfect for professionals and researchers in the fields of measurement and microelectronics. Discover how this innovative technology can enhance your understanding of microsystem metrology and improve device testing and inspection methods.\u003c\/p\u003e","brand":"Anand Asundi","offers":[{"title":"Default Title","offer_id":52247037083990,"sku":"9780470978696","price":128.47,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9780470978696.jpg?v=1767772202","url":"https:\/\/www.englishbook.pt\/products\/digital-holography-for-mems-and-microsystem-metrology-john-wiley-sons-inc-9780470978696-anand-asundi","provider":"Bookshop","version":"1.0","type":"link"}