{"product_id":"metrology-and-diagnostic-techniques-for-nanoelectronics-pan-stanford-publishing-pte-ltd-9789814745086-zhiyong-ma","title":"Metrology and Diagnostic Techniques for Nanoelectronics","description":"\u003cp\u003e\u003cstrong\u003eMetrology and Diagnostic Techniques for Nanoelectronics\u003c\/strong\u003e by Zhiyong Ma, David G. Seiler.\u003c\/p\u003e\n\u003cp\u003ePublished by Taylor \u0026amp; Francis Group, (2016), Hardback, 1454 pages.\u003c\/p\u003e\n\u003cp\u003eTopics: Electronics, Nanoelectronics, Metrology, TECHNOLOGY \u0026amp; ENGINEERING.\u003c\/p\u003e","brand":"Zhiyong Ma","offers":[{"title":"Default Title","offer_id":52235293000022,"sku":"9789814745086","price":406.19,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0886\/3206\/6390\/files\/9789814745086.jpg?v=1767755200","url":"https:\/\/www.englishbook.pt\/products\/metrology-and-diagnostic-techniques-for-nanoelectronics-pan-stanford-publishing-pte-ltd-9789814745086-zhiyong-ma","provider":"Bookshop","version":"1.0","type":"link"}