• Book cover of: Metrology and Diagnostic Techniques for Nanoelectronics. By: Zhiyong Ma

Metrology and Diagnostic Techniques for Nanoelectronics

Zhiyong Ma

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Autorius Zhiyong Ma
Žanras Electronics
Leidimo metai 2016 m.
Puslapių skč. 1454 psl.
Viršelis Kietas viršelis
ISBN 9789814745086
Kategorijos Elektronika, Mechanika

Metrology and Diagnostic Techniques for Nanoelectronics

Metrology and Diagnostic Techniques for Nanoelectronics by Zhiyong Ma, David G. Seiler.

Published by Taylor & Francis Group, (2016), Hardback, 1454 pages.

Topics: Electronics, Nanoelectronics, Metrology, TECHNOLOGY & ENGINEERING.

Book cover of: Metrology and Diagnostic Techniques for Nanoelectronics. By: Zhiyong Ma

Metrology and Diagnostic Techniques f...

€406,19
€406,19 €418,75