VLSI Design and Test

Discover the latest advancements in VLSI technology with VLSI Design and Test by Ambika Prasad Shah. This comprehensive volume, published by Springer International Publishing AG in 2022, features the proceedings of the esteemed 26th International Symposium on VLSI Design and Test (VDAT 2022), held in Jammu, India. Spanning an impressive 596 pages, this first edition presents a curated selection of 32 regular papers and 16 short papers, all meticulously reviewed from over 220 submissions. Perfect for researchers, engineers, and students, this book delves into cutting-edge research and innovative practices in VLSI design and testing. Enhance your knowledge and stay ahead in the dynamic field of VLSI with this essential resource.