VLSI Design and Test

Delve into the innovative world of VLSI with VLSI Design and Test by S. Rajaram. Published by Springer Verlag in 2019, this comprehensive paperback spans 722 pages, presenting a thorough compilation of essential research from the 22nd International Symposium on VLSI Design and Test (VDAT 2018), which took place in Madurai, India.

This carefully curated volume showcases 39 full papers, 11 short papers, and 8 poster presentations, each meticulously reviewed and selected from over 231 submissions. It offers insights from leading experts, making it an invaluable resource for those interested in VLSI design and testing methodologies.

Enhance your understanding of current trends and breakthroughs in VLSI technology with this essential addition to your library. Perfect for researchers, engineers, and students looking to stay ahead in the dynamic field of electronics.